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US Patent Issued to Opsolution on Oct. 27 for "Non-invasive measurement of physiological parameters or substance concentrations in human tissue" (German Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,956, issued on Oct. 27, was assigned to Opsolution GMBH (Kassel, Germany). "Non-invasive measurement of physiological parameters or substan... Read More


US Patent Issued to Bio-Rad Laboratories on Oct. 27 for "Apparatus, system and method for measuring properties of a sample" (British Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,957, issued on Oct. 27, was assigned to Bio-Rad Laboratories Inc. (Hercules, Calif.). "Apparatus, system and method for measuring propertie... Read More


US Patent Issued to The Board of Trustees of the Leland Stanford Junior University on Oct. 27 for "Apparatus for sensitive fluorescence optical measurement of biological parameters in freely behaving animals" (California Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,958, issued on Oct. 27, was assigned to The Board of Trustees of the Leland Stanford Junior University (Stanford, Calif.). "Apparatus for s... Read More


US Patent Issued to NEC on Oct. 27 for "Method for sensing methyl salicylate, methyl salicylate sensor, and method for detecting pathogen infection of plants" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,959, issued on Oct. 27, was assigned to NEC Corp. (Tokyo). "Method for sensing methyl salicylate, methyl salicylate sensor, and method for ... Read More


US Patent Issued to CANON on Oct. 27 for "Substrate, analysis method, apparatus, and method of manufacturing substrate" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,961, issued on Oct. 27, was assigned to CANON K.K. (Tokyo). "Substrate, analysis method, apparatus, and method of manufacturing substrate" ... Read More


US Patent Issued to Gemological Institute of America Inc. (GIA) on Oct. 27 for "Imaging assisted scanning spectroscopy for gem identification" (New Jersey Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,962, issued on Oct. 27, was assigned to Gemological Institute of America Inc. (GIA) (Carlsbad, Calif.). "Imaging assisted scanning spectros... Read More


US Patent Issued to SUMITOMO HEAVY INDUSTRIES on Oct. 27 for "Inspection assistance system, inspection assistance method, and program" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,963, issued on Oct. 27, was assigned to SUMITOMO HEAVY INDUSTRIES LTD. (Tokyo). "Inspection assistance system, inspection assistance method... Read More


US Patent Issued to SCREEN Holdings on Oct. 27 for "Imaging device, inspection device, inspection method and substrate processing apparatus" (Japanese Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,964, issued on Oct. 27, was assigned to SCREEN Holdings Co. Ltd. (Kyoto, Japan). "Imaging device, inspection device, inspection method and ... Read More


US Patent Issued to NTT on Oct. 27 for "Dielectric spectrometry device" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,965, issued on Oct. 27, was assigned to NTT INC. (Tokyo). "Dielectric spectrometry device" was invented by Takuro Tajima (Tokyo), Masahito ... Read More


US Patent Issued to Prince Sattam Bin Abdulaziz University (PSAU) on Oct. 27 for "Spiral resonator material detector" (Saudi Arabia Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,774,966, issued on Oct. 27, was assigned to Prince Sattam Bin Abdulaziz University (PSAU) (Al Kharj, Saudi Arabia). "Spiral resonator material ... Read More